Systematic variations in apparent topographic height as measured by noncontact atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Noncontact atomic force microscopy
No other method has opened the door to progress in nanoscience and nanotechnology as much as the introduction of scanning probe methods did in the 1980s, since they offer a way to visualize the nanoworld. For maximum impact, however, the ability to image and manipulate individual atoms is the key. Initially, scanning tunneling microscopy was the only scanningprobe-based method that was able to ...
متن کاملNoncontact atomic force microscopy II
In order to visualize the atomic structure of materials in real space, a microscope with sub-nanometer resolution is needed. As such, breaking the resolution limit associated with the wavelength of visible light employed in traditional optical microscopy has been a long-standing dream of scientists around the world. This goal was finally reached in the early 1980s with the invention of the scan...
متن کاملNoncontact atomic force microscopy III
Intense interest in nanoscale science and technology has been the main driving force behind a large number of outstanding discoveries in the last few decades. It may not be an overstatement to claim that the development of the various scanning probe methods in the 1980s was the main pre-requisite for the fields of nanoscience and nanotechnology to take off and ultimately evolve to their current...
متن کاملAtomic-Scale Variations of the Mechanical Response of 2D Materials Detected by Noncontact Atomic Force Microscopy.
We show that noncontact atomic force microscopy (AFM) is sensitive to the local stiffness in the atomic-scale limit on weakly coupled 2D materials, as graphene on metals. Our large amplitude AFM topography and dissipation images under ultrahigh vacuum and low temperature resolve the atomic and moiré patterns in graphene on Pt(111), despite its extremely low geometric corrugation. The imaging me...
متن کاملHigh-resolution noncontact atomic force microscopy.
Progress in nanoscience and nanotechnology requires tools that enable the imaging and manipulation of matter at the atomic and molecular scale. During the last two decades or so, scanning probe-based techniques have proven to be particularly versatile in this regard. Among the various probe-based approaches, atomic force microscopy (AFM) stands out in many ways, including the total number of ci...
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ژورنال
عنوان ژورنال: Physical Review B
سال: 2006
ISSN: 1098-0121,1550-235X
DOI: 10.1103/physrevb.74.193313